A high-Q topological refractive index sensor based on high-order corner states

Zihao Yu,Hai Lin,Rui Zhou,Yiting Wang

DOI: https://doi.org/10.1016/j.optlastec.2024.111582

IF: 4.939

2024-08-19

Optics & Laser Technology

Abstract:Terahertz sensors with high sensitivity are essential for accurately detecting substances in various fields such as medical research, diagnostics, security, and molecular analysis. Their effectiveness relies on detecting small index changes that indicate a target, requiring resonance with an extremely high Q factor. Notably, taking advantage of topological corner states with narrow spectral widths and constant eigenfrequencies is a powerful strategy to attain high Q values. Combining the topological edge modes of valley twist states and high-order corner states, we have designed a topological sensor composed of a topological cavity and topological waveguide. The proposed sensor possesses an ultra-high Q value of up to 1.02×105 . The exceedingly narrow linewidth of the topological cavity allows it to detect even the slightest changes in the spectrum, resulting in a high sensitivity of up to 2.06THz/RIU and a notable Figure of Merit (FoM) standing at 3.86×104 . Moreover, the sensor is robust to structural disorder and defects inherent in fabrication processes, ensuring reliable performance in practical applications in different environments and manufacturing conditions.

optics,physics, applied