An Optimal Transport-Embedded Similarity Measure for Diagnostic Knowledge Transferability Analytics Across Machines

Bin Yang,Yaguo Lei,Songci Xu,Chi-Guhn Lee
DOI: https://doi.org/10.1109/tie.2021.3095804
IF: 7.7
2021-01-01
IEEE Transactions on Industrial Electronics
Abstract:The successful applications of deep transfer learning to intelligent fault diagnosis testify to a positive correlation between transferable feature similarity and knowledge transferability across diagnostic tasks. This correlation makes feature similarity possible to assess diagnostic knowledge transferability. Therefore, researchers have attempted various measures for feature similarity, and distance metrics have been adopted as an objective measure for feature distribution discrepancy. However, the commonly used distance metrics cannot address the joint distribution discrepancy (JDD) due to the difficulty in fitting conditional distributions of target domain samples. To overcome the problem, we resort to explore cluster-conditional distributions instead and propose an optimal transport-embedded joint distribution similarity measure (OT-JDSM) that is implemented in two steps. First, a cluster-true label propagation spreads labels from a small number of labeled target domain samples to the whole. Second, the JDD of transferable features is produced via an efficient solution of optimal transport. OT-JDSM is demonstrated on synthetic examples and 144 transfer diagnosis tasks that are created by public and private bearing datasets. The results show that OT-JDSM of transferable features has a stronger correlation with diagnostic knowledge transferability than other distance metrics. Moreover, the OT-JDSM gain can quantify the transfer performance of diagnostic models on tasks.
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