FORCE-DISTANCE SPECTROSCOPY: A GENERIC METHOD TO DETERMINE THE YOUNG'S MODULUS OF FREESTANDING NANOSTRUCTURES

Q. Xiong,S. Tadigadapa,P. Eklund
DOI: https://doi.org/10.31438/trf.hh2006.93
2006-01-01
Abstract:We report here the determination of Young's modulus of bottom-up synthesized nanowires.AFM force-distance spectroscopy was performed at the mid-point of nanowire bridges fabricated using microfabrication techniques.The deflection per unit force was calculated from the difference in slope of the force distance curve on the nanowire bridge and a non-deformable surface.Young's modulus of the nanowires was subsequently deduced from the solution of the first mode of the Euler-Bernoulli beam equation with fixed-fixed boundary condition and a concentrated point load at the mid-point.The dimensions of the bridge were determined from atomic force microscopy (thickness) and field-emission scanning electron microscopy (length and width).We believe this method provides significant improvements on previously reported methods and can be used in any other nano-beam systems to measure their mechanical properties.
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