Precision surface metrology and phase imaging based on femtosecond microwave photonics (Conference Presentation)

Kebin Shi
DOI: https://doi.org/10.1117/12.2321297
2018-01-01
Abstract:Precisely detecting and controlling time jitter of femtosecond laser pulse train can enable high resolution phase measurement by using time of flight (TOF) scheme. In this presentation, we will introduce our recent progresses on precision surface metrology and phase imaging by utilizing high resolution synchronization between radio frequency reference source and femtosecond laser pulse train generated in a passively mode locked fiber laser.
What problem does this paper attempt to address?