The Swift X-ray Cluster Survey

Alberto Moretti,Teng Liu,Jun-Xian Wang,Paolo Tozzi,Elena Tundo,Sergio Campana,Gianpiero Tagliaferri,Mauro Giavalisco
DOI: https://doi.org/10.22323/1.233.0043
2015-01-01
Abstract:The Swift X-ray Cluster Survey (SWXCS) is a catalog obtained using archival data from the Xray telescope (XRT) on board the Swift satellite acquired from 2005 February to 2012 November.We use 3000 observations, covering a total solid angle of 400 deg 2 .We identify extended source candidates in the soft-band (0.5-2 keV) images of these fields using the software EXSdetect, which is specifically calibrated for the XRT data.Extensive simulations are used to evaluate contamination and completeness as a function of the source signal, allowing us to minimize the number of spurious detections and to robustly assess the selection function.The catalog provides positions, soft fluxes, and, when possible, optical counterparts for a flux-limited sample of 263 X-ray group and cluster candidates down to a flux limit of 7 × 10 -15 erg cm -2 s -1 in the soft band.Among them 126 are new detections.Currently, we have collected redshift information for 158 sources (60% of the entire sample).Once the optical follow-up and the X-ray spectral analysis of the sources are complete, the SWXCS will provide a large and well-defined catalog of groups and clusters of galaxies to perform statistical studies
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