Sparse Tomographic Reconstruction of Brain Tissue from Serial Section Electron Microscopy
Zhuge Xiaodong,Batenburg Kees
DOI: https://doi.org/10.3389/conf.fninf.2014.18.00062
2014-01-01
Frontiers in Neuroinformatics
Abstract:Event Abstract Back to Event Sparse Tomographic Reconstruction of Brain Tissue from Serial Section Electron Microscopy Xiaodong Zhuge1* and Kees J. Batenburg1, 2 1 Centrum Wiskunde & Informatica, Scientific Computing, Netherlands 2 Leiden University, Mathematical Institute, Netherlands High throughput imaging of large volumes of brain tissue at synaptic level has the potential to transform the acquired anatomical maps into the realm of Neuroinformatics. This, however, poses a substantial challenge to imaging technologies due to the requirement of both high resolution and large spatial scale. Various types of volume Electron Microscopy (EM) methods have been proposed in recent years for neural circuit reconstruction [1]. While these methods differ in terms of the utilized type of EM and sectioning technique, they are commonly limited in the resolution in the depth direction due to the involved mechanical cutting process. Low depth resolution could significantly reduce the ability to reliably identify different subcellular structures that may play an important role in structural plasticity of neuron connections. Although Electron Tomography (ET) can be applied together with serial section EM methods [2, 3] to computationally improve the depth resolution, it typically requires tens to hundreds of EM images acquired from series of tilt angles in order to generate a satisfactory reconstruction. This severely limits the throughput and exposes the sample with excessive electron-dose causing sample damage. In this work, we show that a reasonable tomographic reconstruction can be achieved using limited data from a small number of projection images. By exploring the information from reconstructions of adjacent sections of the sample and the fact that these sections together form a continuous large area of brain tissue with sparse boundaries, multiple sections are reconstructed simultaneously together as a single reconstruction using iterative reconstruction techniques. This approach helps reduce ambiguities raised by the limited number of projections and the missing wedge, and guides the reconstruction algorithm toward a reasonable numerical solution using only a few projection images. The figure below demonstrates the performances of the reconstruction using the proposed technique. In total 30 of the 100nm sections are reconstructed together with only 5 projection images (range from -70 to 70 degree) for each section. The results show that significant greater depth resolution is achieved for the complete reconstruction comparing to the original 100nm depth resolution. The yellow box highlights the results in a smaller region indicating the image quality of the numerical reconstruction. Furthermore, the reconstructed cross-sections appear to be free of distortion and highly continuous among adjacent sections. The proposed technique has the potential to improve both resolution and throughput of 3D reconstruction, and to provide high quality volume information of brain tissue for better understanding of the relation between functions of the nervous system and the underlying neuronal circuits. Figure 1 References [1] K. L. Briggman, D. D. Bock, “Volume electron microscopy for neuronal circuit reconstruction,” Current Opinion in Neurobiology, Volume 22, Issue 1, February 2012, pp. 154-161 [2] M. Kuwajima, J. M. Mendenhall, K. M. Harris, “Large-volume reconstruction of brain tissue from high-resolution serial section images acquired by SEM-based scanning transmission electron microscopy,” Methods Mol Biol. 2013;950:253-73. doi: 10.1007/978-1-62703-137-0_15 [3] Bock DD, Lee WC, Kerlin AM, Andermann ML, Hood G, Wetzel AW, Yurgenson S, Soucy ER, Kim HS, Reid RC. Network anatomy and in vivo physiology of visual cortical neurons. Nature 471, 177-182 [4] Kasthuri N, Hayworth K, Tapia JC, Schalek R, Nundy S, Lichtman JW. The brain on tape: Imaging an Ultra-Thin Section Library (UTSL). Society for Neuroscience (2009) Keywords: electron tomography, Electron microscopy, connectomics, serial section electron microscopy, neural circuits Conference: Neuroinformatics 2014, Leiden, Netherlands, 25 Aug - 27 Aug, 2014. Presentation Type: Poster, to be considered for oral presentation Topic: Neuroimaging Citation: Zhuge X and Batenburg KJ (2014). Sparse Tomographic Reconstruction of Brain Tissue from Serial Section Electron Microscopy. Front. Neuroinform. Conference Abstract: Neuroinformatics 2014. doi: 10.3389/conf.fninf.2014.18.00062 Copyright: The abstracts in this collection have not been subject to any Frontiers peer review or checks, and are not endorsed by Frontiers. They are made available through the Frontiers publishing platform as a service to conference organizers and presenters. The copyright in the individual abstracts is owned by the author of each abstract or his/her employer unless otherwise stated. Each abstract, as well as the collection of abstracts, are published under a Creative Commons CC-BY 4.0 (attribution) licence (https://creativecommons.org/licenses/by/4.0/) and may thus be reproduced, translated, adapted and be the subject of derivative works provided the authors and Frontiers are attributed. For Frontiers’ terms and conditions please see https://www.frontiersin.org/legal/terms-and-conditions. Received: 26 Apr 2014; Published Online: 04 Jun 2014. * Correspondence: Dr. Xiaodong Zhuge, Centrum Wiskunde & Informatica, Scientific Computing, Amsterdam, Netherlands, zhugexd@gmail.com Login Required This action requires you to be registered with Frontiers and logged in. To register or login click here. Abstract Info Abstract The Authors in Frontiers Xiaodong Zhuge Kees J Batenburg Google Xiaodong Zhuge Kees J Batenburg Google Scholar Xiaodong Zhuge Kees J Batenburg PubMed Xiaodong Zhuge Kees J Batenburg Related Article in Frontiers Google Scholar PubMed Abstract Close Back to top Javascript is disabled. Please enable Javascript in your browser settings in order to see all the content on this page.