A Probability-Based Strong Physical Unclonable Function with Strong Machine Learning Immunity

Zezhong Tu,Yongkang Xue,Pengpeng Ren,Feng Hao,Runsheng Wang,Meng Li,Jianfu Zhang,Zhigang Ji,Ru Huang
DOI: https://doi.org/10.1109/led.2021.3130606
IF: 4.8157
2022-01-01
IEEE Electron Device Letters
Abstract:A novel strong physical unclonable function (PUF), called Probability-based PUF (Prob-PUF), is proposed using the stochastic process of trap emission in nano-scaled transistors. For the first time, the information of trap emission probability is used in the PUF design. This new approach offers ideal immunity to machine learning (ML) attacks. Since Prob-PUF only stores a mathematical model, it naturally avoids the dilemma between the requirement of a large number of challenge-response pairs (CRPs) and the limited storage space, making it a potential solution for future secure storage.
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