Abstract:Many types of radiation particles are found in natural and artificial radiation environments; for instance, protons, electrons, heavy ions and neutrons, gamma rays, and X-rays. These radiation particles may induce transient ionizing dose effects, single event effects, displacement damage, and total ionizing dose effects in electronic devices, resulting in performance degradation, function abnormality, malfunction, and even failure in systems containing these devices. For example, 45% of the observed failures were due to radiation damage in artificial satellites working in space radiation environments. Thus, radiation damage plays a key role in restricting the long-term stability and reliability of electronic devices and the corresponding systems. Simulation test techniques for nuclear and space radiation effects are important foundations of radiation-hardness assurance studies, which can be useful for studying the basic mechanisms of radiation effects and estimating the effectiveness of hardness assurance methods, and indispensable for improving the reliability of electronics and the corresponding systems. In this study, four topics are presented, covering simulation test techniques for transient ionizing dose effects, single event effects, displacement damage, and total ionizing dose effects. For each topic, first, the status of radiation effect studies and experimental equipment suitability for performing radiation effect tests at home and abroad were reviewed. Second, the future development trends, along with the rapid progress in the field of microelectronics, were summarized based on information reported in references, and scientific and technical problems that should be heeded were raised and analyzed. This study can provide a reference for guiding the directions of radiation-hardness assurance.

Reliability Analysis of Ensemble Fault Tolerance for Soft Error Mitigation Against Complex Radiation Effect.

Computational Analysis of Mechanical and Electromigration Reliability Problems

Enhancing Software Reliability Against Soft Error Using Critical Data Model.

Modeling Coupling Impacts of Self-Healing Mechanisms and Dynamic Environments on Systems Subject to Dependent Failure Processes

Reliability evaluation for an electronic system subject to competing risks of dependent soft and hard failures

Reliability analysis for systems with self-healing mechanism in degradation-shock dependence processes with changing degradation rate

A Quantitative Approach for Program Reliability Analysis of Soft Errors

Degradation-Shock-Based Reliability Models for Fault-Tolerant Systems

Reliability Evaluation of FPGA with Common Cause Failure in Multi-Phase Mission

Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults.

Reliability evaluation of spacecraft power generation performance with competitive failure processes under irradiation

Reliability Modeling for Mutually Dependent Competing Failure Processes Due to Degradation and Random Shocks

Formal Analysis of Multiple-Cell Upset Failure Based on Common Cause Failure Theory

Reliability analysis for systems with interactive competing degradation processes and mixed shock effects

Reliability Analysis for Competing Failure Processes with Mutual Dependence of the System under the Cumulative Shock

Reliability analysis for multi-component systems with interdependent competing failure processes

Reliability analysis method of competitive failure processes considering the coupling effect of multiple shock processes and degradation process

A Multi-state Degradation Model for Reliability Assessment of Multi-component Nuclear Safety Systems Considering Degradation Dependency and Random Shocks

Simulation Test Technique for Nuclear and Space Radiation Effects

General Stress-Strength Interference and Gamma Process Combined Method for Space Solar Cell Components Reliability Analysis

Reliability Modeling of Mutual DCFP Considering Failure Physical Dependency