A Hierarchical Fault Injection System for RISC-V Processors Targeting Single Event Upsets in Flip-Flops

Jiyuan Bai,Xiang Wang,Zikang Zhang,Chang Cai,Gengsheng Chen
DOI: https://doi.org/10.1109/asicon52560.2021.9620299
2021-01-01
Abstract:Soft error protection schemes are indispensable for high-density computing clusters and mission-important devices in radiation environments. To evaluate different fault protection schemes, system designers need an efficient approach to undertake fault injection campaigns during the design phase. In this paper, we propose an RTL-level soft error model and construct a hierarchical emulation-based fault injection system to achieve fast and accurate soft error rate estimations for the design and fault sensitive investigation of complex digital systems, in which the modifications to the device under test can be minimized with the best efforts. We build this new fault injection system on a Xilinx ZCU102 board. Experimental results show that the new system has achieved an up to 72.75×speedup compared with simulation-based fault injection systems and has only less than one clock cycle delay for fault injection, which is much faster than peer works based on dynamic partial reconfiguration technology.
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