High-resolution TEM Characterization of Epitaxial Passivation for a High Nitrogen Face-Centered-cubic Phase Formed on AISI 304L Austenitic Stainless Steel in Borate Buffer Solution

S. Tong,H. L. Che,M. K. Lei

DOI: https://doi.org/10.1016/j.electacta.2021.139075

IF: 6.6

2021-01-01

Electrochimica Acta

Abstract:The real-time composition and structure of the passive film formed on a high nitrogen face-centered cubic phase (gamma(N)) layer at the characterized transient corrosion currents from the electrochemical noise analyses in the borate buffer solution with the pH = 7.7 are investigated by the transmission electron microscope (TEM) with energy dispersion X-ray spectrum (EDS) using the focused ion beam (FIB) sampling. The thicker passive film of the gamma(N) phase layer on the nitrided AISI 304L in the borate buffer solutions is observed as two regions structure of O enriched n-type defect spinel gamma-Fe-2(N,O)(3) and hydroxides in the outer region and Cr and N enriched p-type defect spinel (Fe,Cr)(3)(N,O)(4) in the inner region, although few beta-(Fe,Cr)OOH compounds are detected due to dehydration. The defect spinel in directions of < 112 > , < 213 > and < 110 > is epitaxially growing on the gamma(N) phase matrix during the passivation up to 8 h with a decreasing lattice mismatch from 5.9 to 1%, which is attributed to lattice expansion of the gamma(N) phase and the defect spinel. The lattice expansion of the gamma(N) phase at the interface with growing passive film is affected by dissolving nitrogen outward to the borate buffer solution. The dissolving nitrogen in the defect spinel induces its lattice expansion by hydrolysis at the interface. The dense and low-defective passive films on the gamma N phase layer have a significant effect on the corrosion resistance due to inhibition of the absorption of aggressive ion and limitation of the carrier density. (c) 2021 Elsevier Ltd. All rights reserved.