A Method For Software Defect Patterns Customization

De-Peng Wang,Qian Wang,Da-Hai Jin,Yun-Zhan Gong
2014-01-01
Abstract:The pattern based code defect analysis approach finds defects for subject programs with the aid of predefined defect pattern knowledge. The advantage of this kind of approach lies in the simplicity of its usage and the efficiency of its analysis, which makes it a new technique with more rapid development among different approaches of static code defect analysis recently. However, among the available tools based on the approach, the extension modes provided by most of them are neither friendly nor efficient enough for users to extend their defect analysis capability. The author proposes a method for defect patterns customization. The method enables its users to customize defect patterns according to their needs.
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