A New Method For Image Registration Based On Alignment Metric Of Edge Feature Points

D Yang,Yx Ge,Xh Zhang
DOI: https://doi.org/10.1142/9789812701695_0138
2005-01-01
Abstract:In this paper, Angle Histogram and Alignment Metric of edge feature points are defined first. Then a new approach for image registration based on alignment metric of edge feature points is proposed. The image edge and feature points are extracted by wavelet multi-scale product, then alignment metric of feature points can be calculated based on rotation angle obtained from angle histogram. Experiment shows that this algorithm has good performance of robust, quickness and efficiency.
What problem does this paper attempt to address?