Production Variability Analysis Of Semiconductor Back-End Line (Id : 2-038)

Ma Junjie,Zheng Li,Fu Jie,Zhang Hongjie
2006-01-01
Abstract:Reducing cycle time is high priority in production management of most semiconductor manufacturer. According to Little's Law, cycle time reduction could be achieved through WIP reduction. But the challenge is, it would be impossible to safely reduce WIP without any production variability reduction or variability management improvement, if we still want to keep throughput at high level. Because there are many different variability factors inducing WIP congestion or starvation. Furthermore, those variability factor in production systems seems correlated with each other, they combine together to affect performance of production system. It seems to be very complicated to manage them. In this paper, a methodology based on Principal Component Analysis and principal component regression analysis is developed for identifying the major variability factors, uncovering the valuable information hidden behind complicated relationship within them in production environment. Afterwards some solutions to manage major variability factors are suggested to production management. In this paper, frequency of variability factors happening is chosen as analysis parameter. Through methodology of this paper, the most important variability factors are put forth to managers. Based on this analysis, managers could effectively concentrate limited resource on most valuable variability.
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