Unsupervised Anomaly Segmentation Via Multilevel Image Reconstruction and Adaptive Attention-Level Transition

Yi Yan,Deming Wang,Guangliang Zhou,Qijun Chen
DOI: https://doi.org/10.1109/tim.2021.3107586
IF: 5.6
2021-01-01
IEEE Transactions on Instrumentation and Measurement
Abstract:In product inspection scenarios, the objects have different characteristics of textures and different potential anomalies. Still, traditional methods cannot precisely segment structural anomalies and achieve optimal performance on all object categories. This article introduces a flexible multilevel image reconstruction (MLIR) framework for the unsupervised anomaly segmentation task. The MLIR integrates multiple generators with different downsampling ratios to serve as multiple reconstruction levels and leverage an adjustable perceptual similarity measurement to obtain the featurewise reconstruction errors, overcoming the challenge of detecting multiscale anomalies. Leveraging embeddings with different receptive fields for reconstruction, generators perform differently on the same target. Therefore, we depend on the reconstruction uncertainty to propose an adaptive attention-level transition (ALT) strategy that optimizes the detection performance automatically according to the target's category. ALT adjusts the weights of both reconstruction levels and feature measurement scales simultaneously to utilize features at a consistent level for reconstruction and anomaly detection (AD). This strategy remarkably improves the system's adaptivity for different applications. Moreover, we propose reducing the signal-to-noise ratio (SNR) of the images by adding pepper noise so that the reconstruction process is framed as an image denoising task, which improves feature extraction and image restoration robustness. We conduct extensive experiments on the MVTec AD dataset and demonstrate that the proposed method performs satisfactorily to different categories and achieves the state-of-the-art (SOTA) performance.
What problem does this paper attempt to address?