Control system for continuous terahertz target scattering measurement

Li Qi,Fan Changkun,Zhou Yi,Zhao Yongpeng,Chen Deying
2016-01-01
Abstract:The invention, which belongs to the technical field of terahertz detection, provides a control system for continuous terahertz target scattering measurement. With the system problems that the time is wasted and the operation error rate is high because the displacement bench of the existing measuring system needs to be adjusted manually and continuously to collect signals during the measuring process can be solved. The control system comprises a displacement bench control module, a sampling control module and a data storage module. The displacement bench control module consists of a manual adjustment sub module and an automatic measurement sub module; the manual adjustment sub module is used for adjusting a displacement bench manually by the user to control positions of a to-be-measured object and a calibration object; and the automatic measurement sub module is used for inputting a displacement parameter needed for automatic measurement and starting automatic measurement. The sampling control module is used for collecting irradiated scattering echo signals of the to-be-measured object and the calibration object under a terahertz band and for setting a collection parameter. Therefore, scattering echo signal peak values of a calibration object and a to-be-measured object at different angles can be measured accurately in terahertz target scattering characteristic researches.
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