An Image Reconstruction Algorithm Based on Two-Step Iterative Shrinkage/Thresholding for Electrical Resistance Tomography

Shouxiao Li,Joanna N. Chen,Huaxiang Wang,Ziqiang Cui
DOI: https://doi.org/10.1109/i2mtc50364.2021.9460040
2021-01-01
Abstract:Electrical Resistance Tomography (ERT) aims to estimate the electrical properties at the interior of an object from current-voltage measurements on its boundary. Image reconstruction of ERT is a nonlinear and ill-posed inverse problem. Regularization technique is used to solve the inverse problems and two-step iterative shrinkage/thresholding algorithm (TwIST) is a relatively effective method. In order to further improve the noise immunity of iterative threshold algorithm, an improved two-step iterative shrinkage/thresholding algorithm based on 3D modelling is presented in this paper. We transform the sensitivity matrix by singular value decomposition (SVD), and then remove the small singular values which are easy to cause the instability of the solution. Both simulation and experimental results demonstrate that the proposed method can improve the imaging quality obviously.
What problem does this paper attempt to address?