Abstract:Differential phase contrast (DPC) microscopy is a popular methodology to recover quantitative phase information of thin transparent samples under multi-axis asymmetric illumination patterns. Based on spatially partially coherent illuminations, DPC provides high-quality, speckle-free 3D reconstructions with lateral resolution up to twice the coherent diffraction limit, under the precondition that the pixel size of the imaging sensor is small enough to prevent spatial aliasing/undersampling. However, microscope cameras are in general designed to have a large pixel size so that the intensity information transmitted by the optical system cannot be adequately sampled or digitized. On the other hand, using an image sensor with a smaller pixel size or adding a magnification camera adapter to the camera can resolve the undersampling at the expense of a reduced field of view (FOV). To solve this tradeoff, we introduce a new variation of quantitative DPC approach, termed anti-aliased DPC (AADPC), which uses several aliased intensity images under asymmetric illuminations to recover wide-field aliasing-free phase images. Besides, phase transfer functions under different illumination patterns in DPC are analyzed to design an illumination scheme with better phase transfer characteristics. AADPC starts from an initial phase estimate obtained by a DPC-like deconvolution based on the system's weak phase transfer function under discrete half-annular illumination. Then the obtained initial phase map is further refined by the iterative de-multiplexing algorithm to overcome pixel-aliasing and improve the imaging resolution. The data redundancy requirement as well as the optimal illumination scheme of AADPC are analyzed and discussed based on several simulations, suggesting that the spatial undersampling can be mitigated through the iterative algorithm that uses only 4 images, yielding a nearly 4-fold increase in the space-bandwidth product (SBP) compared to the conventional DPC approach. We experimentally verify that AADPC can achieve a half-pitch imaging resolution of 345 nm, corresponding to 1.88× of the theoretical Nyquist-Shannon sampling resolution limit imposed by the sensor pixel size. The high-speed, high-throughput quantitative phase imaging capabilities of AADPC are also demonstrated by imaging HeLa cells mitosis in vitro, achieving a full-pitch lateral resolution of 665 nm across a wide FOV of 1.77mm2 at 25 fps.

A Comprehensive Description of Diffraction Phase Microscopy

Diffraction Phase Microscopy Realized with an Automatic Digital Pinhole

High-Sensitivity Quantitative Phase Microcopy

High-sensitivity Quantitative Phase Microcopy (conference Presentation)

Surface wave illumination Fourier ptychographic microscopy.

Quantitative Phase Imaging Based on Wavefront Correction of a Digital Micromirror Device

A Method Of Diffraction Phase Microscopy And Phase Retrieval With Two-Step

Diffraction Phase Microscopy Using a Defocus Grating

High-Resolution Scanning X-ray Diffraction Microscopy

Theoretical Analysis of Diffraction Imaging in Fourier Ptychography Microscopy

Digital Micromirror Device-Based Common-Path Quantitative Phase Imaging

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

White-light Diffraction Phase Microscopy at Doubled Space-Bandwidth Product.

Three-dimensional Tomographic Microscopy Technique with Multi-Frequency Combination with Partially Coherent Illuminations.

Quantitative real-time phase microscopy for extended depth-of-field imaging based on the 3D single-shot differential phase contrast (ssDPC) imaging method

Quantitative phase microscopies: accuracy comparison

Wide-field Anti-Aliased Quantitative Differential Phase Contrast Microscopy.

High-sensitive and broad-dynamic-range quantitative phase imaging with spectral domain phase microscopy.

A Single-shot Synthetic Aperture Phase Microscope

Single-shot Isotropic Quantitative Phase Microscopy Based on Color-Multiplexed Differential Phase Contrast

Two-exposure Quasi-Common-path Point Diffraction Interferometric Phase Microscopy Using a Four-Step Algorithm