Incipient Fault Detection of Nonlinear Processes Based on Probablility Related SVDD in Local Variable Field

Xiaohui Wang,Yanjiang Wang,Xiaogang Deng,Yuping Cao
DOI: https://doi.org/10.1109/cac51589.2020.9327099
2020-01-01
Abstract:Support vector data description (SVDD) is an effective algorithm for nonlinear process monitoring. However, the conventional SVDD method can't deal with the incipient faults well, which has the small fault amplitude and is easy to be overlapped by industrial noises. Aiming at this problem, an improved SVDD, called probability related SVDD in local variable field (LVPSVDD), is proposed to detect the incipient faults in nonlinear processes. Firstly, the method divides process variables into several local variable fields by hierarchical clustering, and the SVDD model of each variable field is built. Then the sliding window technology is applied to the SVDD distance statistics, and the probability distribution change in the sliding window is measured by Kullback Leibler divergence (KLD). For each local variable field, the corresponding probability related monitoring statistic is developed to replace the original distance statistic. Finally, the global monitoring statistic is obtained by integrating the monitoring results of all local variable fields with Bayesian inference strategy. The method is illustrated with simulation on the continuous stirred tank reactor (CSTR).
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