Half-Life Measurement of 175Hf

Xiong-yu ZHANG,You-qian DING,Xiu-feng WANG,Sheng-dong ZHANG,Peng MA,Zhi-rong LIU
DOI: https://doi.org/10.7538/hhx.2017.39.03.0218
2017-01-01
Abstract:The existing data of 175Hf half-life are few and have large differences,which is unfavorable to use nuclear parameters accurately.In this experiment,175Lu was bombarded by accelerator proton beam and purified by HDEHP extraction leaching resin.Then high purity 175 Hf was obtained,which is free carrier and no interference of 181 Hf.Decontamination factors for 65Zn and 56Co respectively are 5.2 × 103 and 2.3 × 103.137Cs,as a supervision source,was measured lasting 40 days with 175Hf.The half-life value of 175Hf is (70.73± 0.25) d obtained by fitting the relation between the ratio of 343 keV and 661 keV γ-ray counting rate and time.
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