Neural Network with Improved Genetic Algorithm for Eddy Current Testing

Dong-hui LIU,Xiao-yun SUN
DOI: https://doi.org/10.3969/j.issn.1000-6656.2005.09.006
2005-01-01
Abstract:For eddy current testing, genetic algorithm (GA) was adopted, which could overcome the disadvantages of back propagation (BP) artificial neural network (ANN), such as slow convergence and possibility of being trapped on locally minimum value. Moreover, genetic operators were selected by adaptive algorithm to avoid unwanted early convergence. Compared with BP-ANN, the precision and generalization of GA-ANN were improved remarkably.
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