Prediction of Last Time of Life Test

ZHOU Li,HE You,ZOU Hui-chao
DOI: https://doi.org/10.3969/j.issn.1002-0640.2005.03.004
2005-01-01
Abstract:A lot of electronic elements' life can be thought of or approximately be thought of from exponential distribution in engineering.The reliability of the electronic system can be known sufficiently only when the distribution of the life time about various electronic elements were grasped,thus these elements can produce their marked effect in large degree through be arranged rationally and be controlled optimally.The proofs of the exact and approximate methods using the early effect to predict the last time of life test from the exponential distribution of single parameter are given in this paper,and the two results in different condition are compared.
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