Study on microwave magnetic dissipation of Fe1-xBx nanometer thin film

Gang LU,Wei TIAN,Bao-shan ZHANG,Wei-dong XU,Yi YANG,Huan-xian LU
DOI: https://doi.org/10.3969/j.issn.1004-244X.2005.05.008
2005-01-01
Abstract:A series of Fe1-xBx nanometer films are prepared by the direct current sputtering. Resonant chamber pertubation method is used, to measure the microwave magnetic loss of thin films. The results corresponds to the theoretical calculation. The effect of the anisotropy field, saturation intensity and damp coefficient, the component, thickness and the technological conditions of magnetic thin film on the microwave magnetic loss is investigated. It is found that the increase of the anisotropy magnetic field or saturation intensity of thin film and damping coefficient is beneficial to broaden the formant frequency band. The small variety of the damping coefficient will largely work on the value of magnetic loss. The experiment also indicates that the component, thickness and the technological conditions of magnetic thin film greatly affect the magnetic loss.
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