Transfer Learning Based Screen Defect Classification

Li Yilei,Li Chengyuan,Zhang Yifan,Chang Shuo,Zhang Fan,wang zixuan
DOI: https://doi.org/10.4108/eai.27-8-2020.2294670
2020-01-01
Abstract:For the screen defect classification, human inspectors and traditional machine learning algorithms are inefficient and inaccurate. Convolutional neural network (CNN) driven by data are feasible solutions. However, real training images are limited in the industrial scenario, which causes overfitting.
What problem does this paper attempt to address?