Dual-Sheet Interferometric Particle Imaging For Opaque Particle Size And 2d Location Measurement

Zhiming Lin,Yingchun Wu,Zhu Zhuo,Xuecheng Wu
DOI: https://doi.org/10.1016/j.powtec.2020.12.054
IF: 5.64
2021-01-01
Powder Technology
Abstract:Dual-beam interferometric particle imaging (DIPI) has been proposed to measure opaque spherical particle size in the single-point region of interest. This work extends DIPI to measure the size and two-dimensional position of opaque spherical particle in a plane with dual-sheet illumination. A general DIPI model based on geometric optics is established to formulate the interference signal formation of DIPI by modeling the phase difference of two reflected light at far-field. Proof-of-concept experiments, incorporating digital inline holography (DIH), are performed for validation. An interferogram processing algorithm which adopts the sum-of-squared-difference image registration method and Fourier spectrum analysis has been proposed to locate the centroid of each out-of-focus pattern and extract the spatial frequency of fringes, and subsequently particle position and size. The average relative deviation values of DIPI in size measuring and two-dimensional locating are 2.4% and 1.9%, respectively, compared to those values by DIH, which demonstrates the practicability of DIPI in both respects. The extension of DIPI from point-probe to planar measurement promotes its applications to real scenarios, e.g., metal droplet in solid rocket propulsion. (C) 2020 Published by Elsevier B.V.
What problem does this paper attempt to address?