Abstract:We demonstrate the use of a 4-dimensional scanning transmission electron microscope (4D-STEM) to extract atomic cross section information in amorphous materials. We measure the scattering amplitudes of 200 keV electrons in several representative specimens: amorphous carbon, silica, amorphous ice of pure water, and vitrified phosphate buffer solution. Diffraction patterns are recorded by 4D-STEM with or without energy filter at the zero-loss peak. In addition, Electron Energy Loss Spectroscopy (EELS) data are acquired at several thicknesses and energies. Mixed elastic and inelastic contributions for thick samples can be decoupled based on a convolution model. Measured differential cross sections between 1-3 mrad are due primarily to plasmon excitations and follow precisely a 1/θ 2 angular distribution. The measured intensities match Inokuti's calculations of total dipole matrix elements for discrete dipole transitions alone, i.e., transitions to bound states of the atom and not to continuum states. We describe the fundamental mechanism of plasmon excitation in insulators as a two-step interaction process with a fast electron. First, a target electron in the specimen is excited, the probability for which follows from the availability of atomic transitions, with a strong dependence on the column of the periodic table. Second, the dielectric response of the material determines the energy loss. The energy of the loss peak depends primarily on the valence electrons. Elastic scattering is dominant at higher angles, and can be fitted conveniently to 1/θ 3.7 with a linear dependence on atomic number for light atoms. In order to facilitate the interpretation of 4D STEM measurements in terms of material composition, we introduce two key parameters. Zeta is an analytical equivalent of classical STEM Z-contrast, determined by the ratio of elastic to inelastic scattering coefficients, while eta is the elastic coefficient divided by thickness. The two parameters may serve for identification of basic classes of materials in biological and other amorphous organic specimens.

Grazing Incidence Fast Atom Diffraction, Similarities and Differences with Thermal Energy Atom Scattering (TEAS).

Inelastic diffraction of fast atoms on crystal surfaces a Lamb-Dicke regime in shallow atomic collisions

Temperature dependence in fast-atom diffraction at surfaces

A Setup for Grazing Incidence Fast Atom Diffraction.

Grazing Incidence Fast Atom Diffraction: General Considerations, Semiclassical Perturbation Theory and Experimental Implications

Lateral Line Profiles in Fast-Atom Diffraction at Surfaces

Fast atom diffraction inside a molecular beam epitaxy chamber, a rich combination

Terrace effects in grazing-incidence fast atom diffraction from a LiF(001) surface

Fast ion diffraction of protons on NaCl, the discovery of GIFAD

Elastic and inelastic diffraction of fast neon atoms on a LiF surface

High-energy electron diffraction and microscopy

Polar Inelastic Profiles in Fast-Atom Diffraction at Surfaces

Decoherent phonon effects in fast atom-surface scattering

Tensor Theories Of High-Energy Electron-Diffraction And Their Use In Surface Crystallography

High-Energy Time-Resolved Electron Diffraction

EDIC intensity correction of electron diffraction

Parameterized absorptive electron scattering factors

Ultrafast Spectroscopic Investigation of the Aggregation Induced TADF from High-Level Reversed Intersystem Crossing

Quantitative atomic cross section analysis by 4D-STEM and EELS

Direct determination of crystal and surface structures in THEED

Empirical Comparison of Envelope-Tracking and Time-Domain Adaptive Integral Methods for Surface Integral Equations