Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting

Chen Yuchen,Li Chuankang,Hao Xiang,Kuang Cuifang,Liu Xu
DOI: https://doi.org/10.3788/lop57.180001
2020-01-01
Laser & Optoelectronics Progress
Abstract:The resolution of conventional optical microscopes is limited to about half of the wavelength of illumination light due to the optical diffraction limit, which severely limits the observation of finer structures in biological and material research fields. As the most typical and earliest point scanning microscopy, the confocal microscopy has become the most widely used optical microscopy with good optical slicing ability and high signal-to-noise ratio. However, due to the limited cut-off frequency of the confocal microscopy, the improvement of resolution is also limited. Frequency shifting technique aims to move the higher frequency information to the observable frequency range, so as to improve the resolution of point scanning microscopy. In this review, the basic principle, advantages, and disadvantages of point scanning frequency shifting super-resolution imaging technology arc introduced in detail, and its prospect is also given.
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