InGaN Microtube Optical Resonator with Sub-Wavelength Wall Thickness and Its Application to Refractive Index Sensing

Yufeng Li,Peng Hu,Lungang Feng,Mengqi Du,Xilin Su,Qiang Li,Feng Yun
DOI: https://doi.org/10.1063/1.5098295
IF: 2.877
2019-01-01
Journal of Applied Physics
Abstract:Subwavelength freestanding InGaN/GaN quantum well microtubes with a wall thickness of about 50 nm are formed by selective release of a coherently strained bilayer heterostructure from a hosting substrate. Highly polarized spontaneous and stimulated emissions due to whispering gallery mode oscillation were observed in photoluminescence spectra at room temperature. The quality factor was increased by a factor of 3 by elevating the microtube from the substrate and reducing light leakage before threshold. A lasing threshold was characterized as low as 3 mJ/cm2. Microtubes were immersed in different liquids with refractive index variation as small as 0.01 and tested below and above threshold. The peak positions shift obviously while exhibiting excellent repeatability. Using a simple optical probe-detect method, a 5-μm diameter microtube cavity achieves a sensitivity of 40 nm/refractive index unit (RIU) and a detection limit of 6 × 10−3 RIU.
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