Abstract:Recently, deep learning has yielded transformative success across optics and photonics, especially in optical metrology.Deep neural networks (DNNs) with a fully convolutional architecture (e.g., U-Net and its derivatives) have been widely implemented in an end-to-end manner to accomplish various optical metrology tasks, such as fringe denoising, phase unwrapping, and fringe analysis.However, the task of training a DNN to accurately identify an image-to-image transform from massive input and output data pairs seems at best naïve, as the physical laws governing the image formation or other domain expertise pertaining to the measurement have not yet been fully exploited in current deep learning practice.To this end, we introduce a physics-informed deep learning method for fringe pattern analysis (PI-FPA) to overcome this limit by integrating a lightweight DNN with a learning-enhanced Fourier transform profilometry (LeFTP) module.By parameterizing conventional phase retrieval methods, the LeFTP module embeds the prior knowledge in the network structure and the loss function to directly provide reliable phase results for new types of samples, while circumventing the requirement of collecting a large amount of high-quality data in supervised learning methods.Guided by the initial phase from LeFTP, the phase recovery ability of the lightweight DNN is enhanced to further improve the phase accuracy at a low computational cost compared with existing end-to-end networks.Experimental results demonstrate that PI-FPA enables more accurate and computationally efficient single-shot phase retrieval, exhibiting its excellent generalization to various unseen objects during training.The proposed PI-FPA presents that challenging issues in optical metrology can be potentially overcome through the synergy of physics-priors-based traditional tools and data-driven learning approaches, opening new avenues to achieve fast and accurate single-shot 3D imaging.

Deep Learning-based Single Frame Phase Retrieval

Single frame phase retrieval with a deep learning method

Untrained Deep Learning-Based Phase Retrieval for Fringe Projection Profilometry

Single-frame Noisy Interferogram Phase Retrieval Using an End-to-end Deep Learning Network with Physical Information Constraints

Absolute Phase Retrieval for a Single-Shot Fringe Projection Profilometry Based on Deep Learning

End-to-end Single-Shot Composite Fringe Projection Profilometry Based on Deep Learning

Dynamic 3-D measurement based on fringe-to-fringe transformation using deep learning

Label enhanced and patch based deep learning for phase retrieval from single frame fringe pattern in fringe projection 3D measurement.

End-to-end Deep Learning Method for Absolute Phase Retrieval

End-to-end Direct Phase Retrieval from a Single-Frame Interferogram Based on Deep Learning

Deep-learning-enabled geometric constraints and phase unwrapping for single-shot absolute 3D shape measurement

Single-shot Spatial Frequency Multiplex Fringe Pattern for Phase Unwrapping Using Deep Learning

Deep Learning-Based Fringe Pattern Transformation Method for Phase Calculation

Deep-learning-enabled Dual-Frequency Composite Fringe Projection Profilometry for Single-Shot Absolute 3D Shape Measurement

Composite Deep Learning Framework for Absolute 3D Shape Measurement Based on Single Fringe Phase Retrieval and Speckle Correlation

Deep Learning-Enabled Single-Shot Fringe Projection Profilometry with Composite Coding Strategy

Enhanced fringe-to-phase framework using deep learning

Physics-informed Deep Learning for Fringe Pattern Analysis

Generalized framework for non-sinusoidal fringe analysis using deep learning

Fringe Pattern Analysis Using Deep Learning

Near-infrared Fringe Projection Profilometry Based on Deep Learning