Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm

J Zhang,PJ Warwick,E Wolfrum,MH Key,C Danson,A Demir,S Healy,D Kalantar,NS Kim,CLS Lewis,J Lin,A MacPhee,D Neely,J Nilsen,GJ Pert,R Smith,GJ Tallents,JS Wark
1996-01-01
Abstract:We report on measurements of a saturated single frequency Ne-like Ge XUV laser on the J = 0->1 transition at 19.6 nm from a refraction compensating double target driven by 150 J of energy from 75 ps Nd-laser pulses. The 19.6 nm line completely dominated the laser output. The output energy was measured to be 0.9 mJ, corresponding to a conversion efficiency of 6x10(-6).
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