Alterations of the Amplitude of Low-Frequency Fluctuations in Treatment-Resistant and Treatment-Response Depression: A Resting-State Fmri Study

Wen-bin Guo,Feng Liu,Zhi-min Xue,Xi-jia Xu,Ren-rong Wu,Chao-qiong Ma,Sarah C. Wooderson,Chang-lian Tan,Xue-li Sun,Jin-dong Chen,Zhe-ning Liu,Chang-qing Xiao,Hua-fu Chen,Jing-ping Zhao
DOI: https://doi.org/10.1016/j.pnpbp.2012.01.011
2012-01-01
Abstract:Background: Patients with treatment-resistant depression (TRD) and those with treatment-response depression (TSD) respond to antidepressants differently and previous studies have commonly reported different brain networks in resistant and nonresistant patients. Using the amplitude of low-frequency fluctuations (ALFF) approach, we explored ALFF values of the brain regions in TRD and TSD patients at resting state to test the hypothesis of the different brain networks in TRD and TSD patients.Methods: Eighteen TRD patients, 17 TSD patients and 17 gender-, age-, and education-matched healthy subjects participated in the resting-state fMRI scans.Results: There are widespread differences in ALFF values among TRD patients, TSD patients and healthy subjects throughout the cerebellum, the visual recognition circuit (middle temporal gyrus, middle/inferior occipital gyrus and fusiform), the hate circuit (putamen), the default circuit (ACC and medial frontal gyrus) and the risk/action circuit (inferior frontal gyrus). The differences in brain circuits between the TRD and TSD patients are mainly in the cerebellum, the visual recognition circuit and the default circuit.Conclusions: The affected brain circuits of TRD patients might be partly different from those of TSD patients. (c) 2012 Elsevier Inc. All rights reserved.
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