The Peierls-Nabarro Model and the Mobility of the Dislocation Line

B Joos,J Zhou
DOI: https://doi.org/10.1080/01418610108214444
2001-01-01
Philosophical Magazine A
Abstract:Within the framework of the Peierls-Nabarro model we present an analytical model for several of the quantities characterizing the mobility of a dislocation line, which covers the whole range of possible values of dislocation width. These quantities include the first-order Peierls stress sigma (1P) (the minimum stress required to move a straight segment of dislocation), the kink profile, the kink pair activation energy H-kp and the second-order Peierls stress sigma (2P) (the minimum stress required to move a kink in the dislocation line). These quantities are expressed in terms of fundamental properties of the material, and in particular the relevant generalized stacking-fault surface segment.
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