Abstract:Lens-free on-chip microscopy is a powerful and promising high-throughput computational microscopy technique due to its unique advantage of creating high-resolution images across the full field-of-view (FOV) of the imaging sensor. Nevertheless, most current lens-free microscopy methods have been designed for imaging only two-dimensional thin samples. Lens-free on-chip tomography (LFOCT) with a uniform resolution across the entire FOV and at a subpixel level remains a critical challenge. In this paper, we demonstrated a new LFOCT technique and associated imaging platform based on wavelength scanning Fourier ptychographic diffraction tomography (wsFPDT). Instead of using angularly-variable illuminations, in wsFPDT, the sample is illuminated by on-axis wavelength-variable illuminations, ranging from 430 to 1200 nm. The corresponding under-sampled diffraction patterns are recorded, and then an iterative ptychographic reconstruction procedure is applied to fill the spectrum of the three-dimensional (3D) scattering potential to recover the sample's 3D refractive index (RI) distribution. The wavelength-scanning scheme not only eliminates the need for mechanical motion during image acquisition and precise registration of the raw images but secures a quasi-uniform, pixel-super-resolved imaging resolution across the entire imaging FOV. With wsFPDT, we demonstrate the high-throughput, billion-voxel 3D tomographic imaging results with a half-pitch lateral resolution of 775 nm and an axial resolution of 5.43 μm across a large FOV of 29.85 mm2 and an imaging depth of >200 μm. The effectiveness of the proposed method was demonstrated by imaging various types of samples, including micro-polystyrene beads, diatoms, and mouse mononuclear macrophage cells. The unique capability to reveal quantitative morphological properties, such as area, volume, and sphericity index of single cell over large cell populations makes wsFPDT a powerful quantitative and label-free tool for high-throughput biological applications.

Frequency-domain Diagonal Extension Imaging

Axial scanning in lensless microscopy to achieve high resolution

Image Scanning Difference Microscopy

Effect of spatial spectrum overlap on fourier ptychographic microscopy

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Real-Time Super-Resolution Imaging By High-Speed Fluorescence Emission Difference Microscopy

Spatial-frequency-shift Enables Integrated Super-Resolution Microscopy: Advance and Perspective

Isotropic Superresolution Imaging for Fluorescence Emission Difference Microscopy

Deep Learning Enhanced Fluorescence Emission Difference Microscopy

Optical Super-Resolution Imaging Based On Frequency Shift

Extended Depth of Field Reconstruction with Complex Field Estimation

High-Resolution Dmd-Fpm System Based On Ring Pattern Phase Retrieval Algorithm

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

Rapid Image Deconvolution and Multiview Fusion for Optical Microscopy.

Frequency Domain Phase-Shifted Confocal Microscopy (fdpcm) with Array Detection

High-speed Real-Time Single-Pixel Microscopy Based on Fourier Sampling

High-throughput lensless whole slide imaging via continuous height-varying modulation of tilted sensor

High Speed Large-Field-of-view Scanning Microscopy Imaging Technology and System Implementation

Large‐Scale Lensless Microscopy with Fast Acquisition and Region‐Wise Focusing

Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography

Tsang's resolution enhancement method for imaging with focused illumination