Research on a New Reflectance Model for Printing Based on Dot Shape

Qi Wang,Xi Yang,Honghao Liu
DOI: https://doi.org/10.1007/978-981-10-3530-2_54
2017-01-01
Abstract:The relation between dot shape and printing reflectance is researched. Considering the structural characteristics of halftone prints, a new reflectance model of amplitude modulation screening dot is provided. Based on Monte Carlo thinking method, the whole route of photons propagation including incidence, diffusion and termination is simulated in mathematical language according to the particle properties of light. The simulation process not only reflects influencing factors of ink, substrate and dot structure, but also can illustrate two dimensions morphology of screening dots. The results showed that Monte Carlo model indeed can reflect the influence of dot shape. Besides, the simulated value of reflectance model closely approached to the measured data of different dot shape. This new model can visualize various dot structures, which provide a new idea to evaluate printing quality.
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