Investigation on Microelectrode .8. the Retention Effect of Voltammogram at Microdisk Electrode

HX JU,HY CHEN,H GAO
1992-01-01
Acta Chimica Sinica
Abstract:The edge effect and specific double-layer capacitance at microdisk electrode were studied by means of cyclic sweep voltammetry. The concept of retention effect was proposed to describe the degree of deviation between actual voltammetric curve and ideal steady state curve at microdisk electrode and to explain the cause which brings about the separation between forward and reverse sweeps at cyclic voltammetric curve. The formulae for calculating the ratio of retention and the concentrations of reactant and product in reaction area on surface of microdisk electrode were also presented. The ratio of retention is proportional to square root of scan rate. The experimental results can be satisfactorily explained by the theoretical calculation.
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