AFM Observation of the Change of Surface Morphology During Layer-by-layer Self-assembly of DNA and PEI

Yan-zhi Tian,Yan-li Li,Yong Jiang
DOI: https://doi.org/10.3724/sp.j.1105.2014.13312
2014-01-01
Abstract:Negatively-charged DNA and positively-charged polyethylenimine (PEI) were selected to form layer-by-layer self-assembly films on different substrates. The changes of film morphologies and surface roughness during the assembly processes were observed and measured in detail by AFM at a molecule level. The influences of DNA concentration, ion concentration, substrate and modification method on the self-assembly films were analyzed in detail in order to understand the interaction between DNA and PEI. The results show that all the above factors affect the surface morphologies and roughness of the DNA/PEI films. It was found when the DNA/PEI film was self-assembled on mica surface modified by PEI, the increase of surface roughness followed a zigzag pattern with increasing the number of layers. The study may help us understand the molecular mechanism of layer-by-layer self-assembly.
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