Atomic Force Microscope Characterization of Self-Assembly Behaviors of Cyclo[8] Pyrrole on Solid Substrates

Hai Xu,Siqi Zhao,Xiang Xiong,Jinzhi Jiang,Wei Xu,Daoben Zhu,Yi Zhang,Wenjie Liang,Jianfeng Cai
DOI: https://doi.org/10.1016/j.cplett.2017.02.063
IF: 2.719
2017-01-01
Chemical Physics Letters
Abstract:Cyclo [8] pyrrole (CP) is a porphyrin analogue containing eight α-conjugated pyrrole units which are arranged in a nearly coplanar conformation. The π-π interactions between CP molecules lead to regular aggregations through a solution casting process. Using tapping mode atomic force microscope (AFM), we investigated the morphology of self-assembled aggregates formed by deposition of different CP solutions on different substrates. We found that in the n-butanol solution, nanofibrous structures could be formed on the silicon or mica surface. Interestingly, on the highly oriented pyrolytic graphite (HOPG) surface, or silicon and mica surface with a toluene solution, only irregular spherical structures were identified. The difference in the nanomorphology may be attributed to distinct interactions between molecule-molecule, molecule-solvent and molecule-substrate.
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