Investigation of projectile fragment emission in the fragmentation of [math]Si on C target at 736 A MeV

Ying-Hua Dang,Jun-Sheng Li,Dong-Hai Zhang,Ya-Ting Xi,Satoshi Kodaira,Nakahiro Yasuda
DOI: https://doi.org/10.1142/s0218301324500307
IF: 0.924
2024-08-21
International Journal of Modern Physics E
Abstract:International Journal of Modern Physics E, Volume 33, Issue 07, July 2024. The emission angular distributions, the transverse momentum distributions and the temperature parameters of projectile fragments produced in fragmentation of [math]Si on C target at 736[math]A[math]MeV are measured. It is found that the scattering angle of primary silicon ions is smaller than the emission angle of their fragments. The average value and the width of the angular distribution and the transverse momentum distribution are increased with the decrease of the charge of projectile fragments. The cumulative squared transverse momentum distribution of projectile fragments can be well fitted by a single Rayleigh distribution, which indicates that the projectile fragments are emitted from a single temperature emission source. Most of the temperature parameters of projectile fragments emission source are in the range of 2–5[math]MeV, which does not obviously depend on the charge of the projectile fragments.
physics, particles & fields, nuclear
What problem does this paper attempt to address?