Abstract:Resolving gas phase molecular motions with simultaneous spatial and temporal resolution is rapidly coming within the reach of x-ray Free Electron Lasers (XFELs) and Mega-electron-Volt (MeV) electron beams. These two methods enable scattering experiments that have yielded fascinating new results, and while both are important methods for determining transient molecular structures in photochemical reactions, it is important to understand their relative merits. In the present study, we evaluate the respective scattering cross sections of the two methods and simulate their ability to determine excited state molecular structures in light of currently existing XFEL and MeV source parameters. Using the example of optically excited N-methyl morpholine and simulating the scattering patterns with shot noise, we find that the currently achievable signals are superior with x-ray scattering for equal samples and on a per-shot basis and that x-ray scattering requires fewer detected signal counts for an equal fidelity structure determination. Importantly, within the independent atom model, excellent structure determinations can be achieved for scattering vectors only to about 5 Å-1, leaving larger scattering vector ranges for investigating vibrational motions and wavepackets. Electron scattering has a comparatively higher sensitivity toward hydrogen atoms, which may point to applications where electron scattering is inherently the preferred choice, provided that excellent signals can be achieved at large scattering angles that are currently difficult to access.

Comparisons Between XAFS Signals Measured in Transmission and Total Electron Yield Mode

A Simulation Study on the Flash X-Ray Spectra Spatial Distribution

Study of X‐ray Absorption Near‐edge Structure with a Photoemission Electron Microscope

Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer

Energy Spectra of Backscattered Electrons in Auger Electron Spectroscopy: Comparison of Monte Carlo Simulations with Experiment

Comparison of different methods for evaluating the transmission function of a two-stage cylindrical mirror analizer in XPS applications

The Measurements of Total Electron Yield from Silver

Comparison of available measurements of the absolute fluorescence yield

Comparison of Monte Carlo tally techniques for dosimetry in a transmission-type x-ray tube

Monte Carlo Simulation of Auger Electron Emission from Thin Film on Substrate

Ultrafast x-ray and electron scattering of free molecules: A comparative evaluation

Simulation of Electron Scattering and Transmission in Characterization of Thick Films by Scanning Transmission Electron Microscopy

Transient X‐Ray Absorption Near Edge Structure Spectroscopy Using Broadband Free‐Electron Laser Pulses

Electron Transport Coefficients in Sf6 and Xenon Gas Mixtures

Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter

Laboratory X-Ray Spectrometer for XAFS Measurements

Direct Measurement of Ion and Electron Flux Ratio at Their Respective Sheath-Edges and Absence of the Electron Bohm Criterion Effects

Measurement of the scintillation yield of low-energy electrons in liquid xenon

Thickness Measurements by Electron Energy Loss Spectroscopy (EELS)

Preliminary Experiments of Thomson Scattering X-Ray Source:Measurements of Electron Beam's Parameters and Their Influence on the X-Ray Performance

Measurement of the Scintillation and Ionization Response of Liquid Xenon at MeV Energies in the EXO-200 Experiment