Monte Carlo Simulation of X-ray Backscatter Detection for the Seam Tracking when Welding Sandwich Panels

Angang Wei,Zandong Han,Baohua Chang,Haigang Li,Jiguo Shan,Dong Du
DOI: https://doi.org/10.1088/1742-6596/1074/1/012186
2018-01-01
Journal of Physics Conference Series
Abstract:The I-core sandwich panels are widely utilized in manufacturing lightweight structures in a variety of fields, such as aviation, aerospace, shipping, and so on. However, due to their structural characteristics, it is difficult to track the weld seam automatically in the welding process. At present, a detection method based on the backscattered X-rays is widely used for seam tracking of the sandwich panels. The conventional modelling based on analytical method has been applied in the simulation of X-ray backscatter detection system, but analytical method has a deviation from the actual situation under the low X-ray intensity. In this paper, a simulation model based on Monte Carlo method is proposed to simulate the X-ray backscatter detection system for the automatic seam tracking in the welding of such sandwich panels. The effect of photon energy and beam intensity on the detector counting is analysed. The result shows that the proposed method can accurately simulate the X-ray backscatter detection system for the automatic seam tracking when welding sandwich panels; the proposed simulation method can provide more accurate simulation results and more time domain information of photons at a relatively low beam intensity. The proposed method can also provide information as a basis for the optimization of the X-ray backscatter detection system at a relatively low dose.
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