Abstract:Many types of radiation particles are found in natural and artificial radiation environments; for instance, protons, electrons, heavy ions and neutrons, gamma rays, and X-rays. These radiation particles may induce transient ionizing dose effects, single event effects, displacement damage, and total ionizing dose effects in electronic devices, resulting in performance degradation, function abnormality, malfunction, and even failure in systems containing these devices. For example, 45% of the observed failures were due to radiation damage in artificial satellites working in space radiation environments. Thus, radiation damage plays a key role in restricting the long-term stability and reliability of electronic devices and the corresponding systems. Simulation test techniques for nuclear and space radiation effects are important foundations of radiation-hardness assurance studies, which can be useful for studying the basic mechanisms of radiation effects and estimating the effectiveness of hardness assurance methods, and indispensable for improving the reliability of electronics and the corresponding systems. In this study, four topics are presented, covering simulation test techniques for transient ionizing dose effects, single event effects, displacement damage, and total ionizing dose effects. For each topic, first, the status of radiation effect studies and experimental equipment suitability for performing radiation effect tests at home and abroad were reviewed. Second, the future development trends, along with the rapid progress in the field of microelectronics, were summarized based on information reported in references, and scientific and technical problems that should be heeded were raised and analyzed. This study can provide a reference for guiding the directions of radiation-hardness assurance.

Technical Overview of the Electronic Components Selection for Spacecraft

Overview of COTS in Application of Satellites

Design of radiation-hardened real-time operating system for pico-satellites

Radiation Hardness Assurance of Single Event Effects on Components for Space Application

Limitations and Countermeasures of Plastic Encapsulated Microcircuits for Spacecraft

Overview of radiation hardening techniques for IC design

Research Summary of the Multiparameter Combined Environmental Test of Spacecraft Component Reliability

Reliability Analysis and Utilization of PEMs in Space Application

Feasibility Test and Analysis of BlueCore Chip in Space Application

Design of Onboard Avionics Based on Commercial Off-the-Shelf Parts for TianQi-2 Nanosatellite

Structural design and mechanical analysis for space-borne electronic equipment

Research Progress of Space Electrons Radiation Risk and Its Protection Strategy

Integrated Platform of On-Board Computer and Star Sensor Electronics System Based on COTS

Study the performance of star sensor influenced by space radiation damage of image sensor

Simulation Test Technique for Nuclear and Space Radiation Effects

Simulation and Calculation Method of Total Ionizing Dose Radiation Resistance of Aerospace Components based on in-Orbit Data

Scalable Architecture Model for Spacecraft's Electronic System

A Case for Application-Aware Space Radiation Tolerance in Orbital Computing

Simulation and Analysis of In-Orbit Applications under Radiation Effects on COTS Platforms

Research on B4C/PEEK Composite Material Radiation Shielding

Design and Implementation of a Low-Cost Fault-Tolerant On-Board Computer for Micro-Satellite