Monitoring Deep Dielectric Charging Effects in Space

Xiangqian Yu,Siyu Song,Hongfei Chen,Yanan Qu,Hong Zou,Qiugang Zong,Weihong Shi,Jiqing Zou,Weiying Zhong,Hongwen Xiang,Sipei Shao
DOI: https://doi.org/10.1109/tns.2019.2963171
IF: 1.703
2020-01-01
IEEE Transactions on Nuclear Science
Abstract:A deep dielectric charging effects monitor was proposed for providing in situ measurements of deep dielectric charging effects on satellites via measurements of the surface leakage currents and the internal charging potential of the dielectric. The detailed design and the first flight results onboard a medium Earth orbit (MEO) navigation satellite were discussed. Large temporal variations of the leakage currents were observed in the outer zone. The first flight data showed that the maximum charging electric field of the FR4 dielectric was less than 1.5 x 10(4) V/m, the incident internal flux was less than 100 pA/m(2), and no charging risk was determined in this period. The calculated conductivity of the FR4 dielectric was about 1.4-3.7 x 10(-15) S/m. These results showed that conductivity obtained by the traditional method overestimated the true value, whereas that obtained by the charge decay method underestimated the true value.
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