Abstract:1T1R spin-transfer-torque (STT) MRAM is a promising candidate for next-generation high-density embedded non-volatile memory [1-2]. However, 1T1R STT-MRAM suffers from limited sensing margin and high write power. As shown in Fig. 30.2.1(a), sense amplifier design is challenging due to the small difference (only 2x) between the high-resistance state (R AP ) and the low-resistance state (R P ), as well as R AP degradation with increasing temperature. Moreover, R P and R AP resistance distributions shift with process variation, requiring a read reference (V ref ) that tracks process. To improve the sensing margin, several offset-cancellation methods have been reported to reduce sense amplifier mismatch [3]. However, these methods use multiple capacitors and hence incur significant area overheads. To address this issue, we propose an offset-cancelled sense amplifier that uses only a single capacitor to significantly improve the sensing margin by more than 60%. A second design challenge for STT-MRAM stems from the high current needed to flip a cell during a write operation. For non-volatile memory applications with a 10-year retention time requirement, the write current can be as high as several hundred μA. However, as shown in Fig. 30.2.1(b), the required write time varies with the state change required (0→1 or 1→0), process variation, and temperature. As a result, a fixed write time that ensures successful write for all conditions wastes a significant energy for typical or average conditions. We propose an in situ write-self-termination method to reduce write energy in most scenarios. The sense amplifier is reconfigured to continuously monitor the write operation and automatically shuts off the write drivers when the state transition is detected, without an area or timing penalty. In addition, dual dummy columns are added in each array to provide read V ref tracking of row-wise PVT variation. A 1Mb STT-MRAM was fabricated in 28nm technology, and achieves a 2.8ns read-access time at 25°C and 3.6ns at 120°C, respectively. With in-situ self-write-termination the write power is reduced by 47% with a 20ns write-access time at 25°C and by 60% at 120°C.

A Low-power High-reliability STT-MRAM Write Scheme with Real-time Voltage Sensing Module

A 16 Kb Spin-Transfer Torque Random Access Memory with Self-Enable Switching and Precharge Sensing Schemes

Design of the writing circuit with a low supply voltage for the spin-transfer torque random access memory

High-Speed, Low-Power, and Error-Free Asynchronous Write Circuit for Stt-Mram and Logic

Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET

High Speed and Reliable Sensing Scheme with Three Voltages for STT-MRAM.

A Self-Timed Voltage-Mode Sensing Scheme With Successive Sensing and Checking for STT-MRAM

A 1mb 28nm Stt-Mram With 2.8ns Read Access Time At 1.2v Vdd Using Single-Cap Offset-Cancelled Sense Amplifier And In-Situ Self-Write-Termination

A Self-Matching Complementary-Reference Sensing Scheme for High-Speed and Reliable Toggle Spin Torque MRAM.

Ultra-low Power Access Strategy for Process-Voltage-Temperature Aware STT-MRAM

Optimization Scheme to Minimize Reference Resistance Distribution of Spin-Transfer-Torque MRAM

Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

Novel Self-timing Speculative Writing for Unreliable STT-MRAM

A High-reliability Reading Scheme for STT-MRAM with a Symmetric Dual-reference Sensing Amplifier

The Write Deduplication Mechanism Based On A Novel Low-Power Data Latched Sense Amplifier For A Magnetic Tunnel Junction Based Non-Volatile Memory

Novel dual power hybrid write operation structure for STT-MRAM

Dynamic Reference Sensing Scheme for Deeply Scaled STT-MRAM

EXTENT: Enabling Approximation-Oriented Energy Efficient STT-RAM Write Circuit

A 1-Mb 28-Nm 1T1MTJ STT-MRAM with Single-Cap Offset-Cancelled Sense Amplifier and in Situ Self-Write-Termination

A Novel Positive-feedback Read Scheme with Tail Current Source of STT-MRAM

Quantitative Evaluation of Reliability and Performance for STT-MRAM