Abstract:Visual surface defect inspection provides an important tool for product quality assessment in a wide range of industrial applications. In recent years, diverse convolutional neural network (CNN) models have been devel-oped for the high-accuracy image classification of natural objects. However, it remains a challenging task to develop deep-learning-based approaches for surface defect inspection of industrial products. The main challenge is that surface defects of industrial products occur in low probability, therefore it is impractical to build a large image dataset containing different types of defects to train/fine-tune deep CNN models to achieve satisfactory performance when applied to industrial inspection tasks. To overcome the above-mentioned problem, we build a light-weight defect classification model based on the pre-trained SqueezeNet architecture and present three effective techniques to achieve high-accuracy defect classification using very few collected defective training samples. First, we experimentally demonstrate that it is reasonable to freeze shallower convolutional layers and only fine-tune deeper layers in the last convolutional stage when there are not enough training samples. Second, we integrate batch-size independent Group Normalization (GN) into SqueezeNet to compute stable statistics based on a limited number of defective samples for training the classification model. Third, we add an auxiliary task to perform the similarity comparison of two defective samples during the training phase, significantly increasing the size of the training data and generating more distinctive defect-specific representations. The experimental results on the NEU-CLS dataset and USB-FS dataset verify the effectiveness of the proposed method. Our method can obtain accurate defect classification results when very few defective training samples are provided, i.e., about 97.69% and 82.92% average classification accuracy on the NEU-CLS and USB-FS datasets, respectively, under the 5-shot setting (5 images per defect category).

A Hierarchical Feature Fusion-based Method for Defect Recognition with a Small Sample

Small-scale defect detection in industrial environment based on lightweight deep learning network

Coarse-to-Fine Few-Shot Defect Recognition with Dynamic Weighting and Joint Metric

Hierarchical Multi-Scale Network for Cross-Scale Visual Defect Detection

A Multi-level spatial feature fusion-based transformer for intelligent defect recognition with small samples toward smart manufacturing system

Multi-scale Attention and Dilation Network for Small Defect Detection

Defect classification on limited labeled samples with multiscale feature fusion and semi-supervised learning

A Multi-Source Transfer Learning-Based Weighted Network for Small Sample Defect Inspection

A Deep Learning-Based Surface Defect Inspection System Using Multiscale and Channel-Compressed Features

An Effective Industrial Defect Classification Method under the Few-Shot Setting Via Two-Stream Training

Small object detection method with shallow feature fusion network for chip surface defect detection

TL-SDD: A Transfer Learning-Based Method for Surface Defect Detection with Few Samples

MFNet: A Novel Multilevel Feature Fusion Network With Multibranch Structure for Surface Defect Detection

Toward Small Sample Challenge in Intelligent Fault Diagnosis: Attention-Weighted Multidepth Feature Fusion Net With Signals Augmentation

Few-shot defect detection using feature enhancement and image generation for manufacturing quality inspection

A Generative Adversarial Network Based Deep Learning Method for Low-Quality Defect Image Reconstruction and Recognition

Attention-Based Multiscale Feature Fusion for Efficient Surface Defect Detection

Decision Fusion Network with Perception Fine-tuning for Defect Classification

A lightweight and efficient model for surface tiny defect detection

AFFNet: An Attention-Based Feature-Fused Network for Surface Defect Segmentation

Small object detection using deep feature learning and feature fusion network