Prediction of Working Memory Ability Based on EEG by Functional Data Analysis

Yuanyuan Zhang,Chienkai Wang,Fangfang Wu,Kun Huang,Lijian Yang,Linhong Ji
DOI: https://doi.org/10.1016/j.jneumeth.2019.108552
IF: 2.987
2020-01-01
Journal of Neuroscience Methods
Abstract:BACKGROUND:There is always a demand for fast and accurate algorithms for EEG signal processing. Owing to the high sample rate, EEG signals usually come with a large number of sample points, making it difficult to predict the working memory ability in cognitive research with EEG.NEW METHOD:Following well-designed experiments, the functional linear model provides a simple framework for regressions involving EEG signal predictors. The use of a data-driven basis in a linear structure naturally extends the standard linear regression model. The proposed approach utilizes B-spline approximation of functional principal components that greatly facilitates implementation.RESULTS:Using LASSO feature selection, critical features have been extracted from eight frontal electrodes, and the R-square of 0.72 indicates rather strong linear association of actual observations and out-of-sample predictions.COMPARISON WITH EXISTING METHODS:There does not seem to be any existing methods of predicting working memory ability from N-back task tests via EEG signals; the data-driven functional linear regression method proposed in this work is, to the best of our knowledge, the first of its kind.CONCLUSIONS:The data analytics suggest that a multiple functional linear regression model for the predictive relationship between working memory ability and frontal activity of the brain is both feasible and accurate via EEG signal processing.
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