Epitaxial growth and air-stability of monolayer Cu₂Te

K. Qian,L. Gao,H. Li,S. Zhang,J. H. Yan,C. Liu,J. O. Wang,T. Qian,H. Ding,Y. Y. Zhang,X. Lin,S. X. Du,H-J Gao

DOI: https://doi.org/10.1088/1674-1056/ab5781

2020-01-01

Chinese Physics B

Abstract:A new two-dimensional atomic crystal, monolayer cuprous telluride (Cu2Te) has been fabricated on a graphene-SiC(0001) substrate by molecular beam epitaxy (MBE). The low-energy electron diffraction (LEED) characterization shows that the monolayer Cu2Te forms a root 3x root 3 superstructure with respect to the graphene substrate. The atomic structure of the monolayer Cu2Te is investigated through a combination of scanning tunneling microscopy (STM) experiments and density functional theory (DFT) calculations. The stoichiometry of the Cu2Te sample is verified by x-ray photoelectron spectroscopy (XPS) measurement. The angle-resolved photoemission spectroscopy (ARPES) data present the electronic band structure of the sample, which is in good agreement with the calculated results. Furthermore, air-exposure experiments reveal the chemical stability of the monolayer Cu2Te. The fabrication of this new 2D material with a particular structure may bring new physical properties for future applications.