XCR4C: A Rad-Hard Full-Function CDS ASIC for X-ray CCD Applications

Bo Lu,Jia Huo,Yong Chen,Bo Li,Hainan Liu,Jiajun Luo,Yumei Zhou

DOI: https://doi.org/10.1109/nssmic.2018.8824616

2018-01-01

Abstract:We report in this work the development of a four-channel rad-hard full-function correlated double sampling (CDS) ASIC (XCR4C) targeting the readout of X-ray charge-coupled devices (CCDs) for applications in the fields of X-ray spectroscopy, imaging and timing observations. We upgrade the ASIC by integrating both a baseline adjustment circuit (BLA) and a discriminator in the CDS circuit. The ASIC is implemented in a novel differential switched-capacitor (SC) architecture, which makes it high linear, low power, immune to commom-mode noise and interferences as well as easy configurable. Particularly, the readout speed is boosted from 100 kHz to 10 MHz. Also, some total ionizing dose (TID)-oriented rad-hard by design techniques are used to combat the harsh low-earth-orbit (LEO) space environment, among which we describe in detail the even-finger double-side bulk butting (EFBB) layout technique. XCR4C ASIC is fabricated with AMS 0.35 μm 2P4M bulk CMOS with an epitaxial layer and occupies a chip area of 3.47×1.84 mm 2 . The preliminary experimental results show, the ASIC achieves maximum 23 ppm integral nonlinearity (INL) and 5.8 e - equivalent noise charge (ENC) under a typical 1 MHz pixel rate, and only consumes 50 mW approximately from a single 3.3 V supply voltage. After irradiated by 300 krad(Si) TID using 60 Co with 50 rad(Si)/s dose rate, the performance degradations are negligible.