Adaptive Extended Isogeometric Analysis Based on PHT-splines for Thin Cracked Plates and Shells with Kirchhoff–Love Theory

H. S. Yang,C. Y. Dong
DOI: https://doi.org/10.1016/j.apm.2019.07.002
IF: 5.336
2019-01-01
Applied Mathematical Modelling
Abstract:In this paper, a posteriori error estimation and mesh adaptation approach for thin plate and shell structures of through-the-thickness crack is presented. This method uses the extended isogeometric analysis (XIGA) based on PHT-splines (Polynomial splines over Hierarchical T-meshes), which is abbreviated as XIGA-PHT. In XIGA-PHT, the isogeometric displacement approximation is locally enriched with enrichment functions, which efficiently capture the displacement discontinuity across the crack face as well as the stress singularity in the vicinity of the crack tip. On the one hand, the rotational degrees of freedom (RDOFs) are not required in Kirchhoff-Love theory, which drastically reduces the complexity of enrichment mode and computational scale for crack analysis. On the other hand, the PHT-splines basis functions can automatically satisfy the requirement of C-1-continuity for the Kirchhoff-Love theory. Moreover, the PHT-splines facilitate the local refinement, which is the deficiency of NURBS-based isogeometric formulations. The local refinement is highly suitable for adaptive analysis. The stress recovery-based posteriori error estimator combined with the superconvergent patch recovery (SPR) technique is used to evaluate the approximate local discretization error. A new strategy for selecting enriched recovered functions in the enriched areas was proposed. Special functions extracted from the asymptotic stress solutions are applied to obtain the recovered stress field in the enriched area. The results of stress intensity factors or J-integral values obtained by the adaptive XIGA-PHT are compared with reference solutions. Several thin plate and shell illustrative examples demonstrate the effectiveness and accuracy of the proposed adaptive XIGA-PHT. (C) 2019 Elsevier Inc. All rights reserved.
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