Fabrication And Test Of A W-Band Three-Slot-Staggered-Ladder Coupled-Cavity Twt Circuit

Zhigang Lu,Zhicheng Su,Ruidong Wen,Weihua Ge,Zhanliang Wang,Tao Tang,Huarong Gong,Yubin Gong
DOI: https://doi.org/10.1109/ivec.2019.8745049
2019-01-01
Abstract:In this paper, we report the fabrication and test of a W-band three-slot-staggered-ladder coupled-cavity TWT slow wave circuit. The process of fabrication involves coupled-cavity diaphragms, transition waveguides, and ceramic-window structures machining. Meanwhile the assembly is realized by the specially designed molds. The cold test was carried out using the Vector Network Analyzer (VNA). The measured S-parameters S-11 is less than -10dB in the band of 92-99 GHz. The voltage stand wave ratio (VSWR) shows a good agreement with the simulation results. These results lay the foundation for the realization of the W-band three-slot-staggered-ladder coupled-cavity TWT.
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