Application of Biparametric Perturbation Method to Functionally Graded Thin Plates with Different Moduli in Tension and Compression

Xiao-Ting He,Xue Li,Zhi-Xin Yang,Guang-Hui Liu,Jun-Yi Sun

DOI: https://doi.org/10.1002/zamm.201800213

2019-01-01

Abstract:In this study, a biparametric perturbation method is used for the solution of the large-deflection bending problem of a functionally graded thin plate with different moduli in tension and compression. First, the Foppl-von Karman equations for the bimodular functionally graded thin plate are established in rectangular coordinates system, thus obtaining the axisymmetric simplified form in polar coordinates system. By adopting two groups of perturbation parameters, one group is gradient index and central deflection, another is gradient index and load, the biparametric perturbation solution for the established governing equations are obtained, respectively, under different boundary constrains. The result indicates that the two groups of parameter selections are valid, and the biparametric perturbation solution is also consistent to single-parameter perturbation solution. The bimodular effects on stiffness and deformation of thin plates are also discussed via biparametric perturbation solutions obtained. The study indicates that the dominant factor influencing the stiffness is the relative magnitudes relation among the tensile modulus, the neutral layer modulus and the compressive modulus.