Cold‐Sintered C0G Multilayer Ceramic Capacitors

Dawei Wang,Di Zhou,Kaixin Song,Antonio Feteira,Clive A. Randall,Ian M. Reaney
DOI: https://doi.org/10.1002/aelm.201900025
IF: 6.2
2019-01-01
Advanced Electronic Materials
Abstract:Multilayer ceramic capacitors (MLCCs) based on (Bi0.95Li0.05)(V0.9Mo0.1)O-4-Na2Mo2O7 (BLVMO-NMO), with epsilon(r) = 39, temperature coefficient of capacitance, TCC approximate to +/- 0.01%, and tan delta = 0.01 at 1 MHz, are successfully fabricated by a cold-sintering process at 150 degrees C. Scanning electron microscopy of the MLCCs combined with EDS mapping, X-ray diffraction, and Raman spectroscopy reveals well-laminated and undistorted dielectric layers composed of BLVMO and NMO discrete phases separated by Ag internal electrodes. Prototypes show comparable properties to C0G MLCCs (TCC = +/- 30 ppm degrees C-1 from -55 to +125 degrees C) currently commercially fabricated at 1100 degrees C using CaZrO3-based dielectrics with glass sintering aids and Ni internal electrodes.
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